Advisory Committee

Prof. Y. S. WONG

Honorary Chair

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Advisory Committee

Prof. K. C. HO

Honorary Co-Chair

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Organizing Committee

Dr. George LAU

General Chair

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Keynote Speakers

Dr. Lore KIEFERT

Chief Gemmologist, Gubelin Gem Lab., Switzerland

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Keynote Speakers

Mr. Daren SLEE

Member of the Leadership for the F. & F. A. (Chair) & R. A. T. C., IEEE

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Keynote Speakers

Mr. Mark I. MONTROSE

Founder and First President of the IEEE Product Safety Engineering Society

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Keynote Speakers

Mr. Richard W. O’Brien

Director, Office of International Programs & Intergovernmental Affairs, US CPSC

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Keynote Speakers

Mr. Dennis W. K. LEE

Head of Standards & Calibration Laboratory, Innovation and Technology Commission, Government of HKSAR

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Keynote Speakers

Mr. Peter UNGER

Chairman, International Laboratory Accreditation Cooperation (ILAC)

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IMPORTANT DATES:

Paper submission deadline:
10 Oct 2014 20 Oct 2014

Notification to authors of acceptance:
20 Oct 2014 24 Oct 2014

Registration start date: 15 Oct 2014

Conference Date: 12-14 Nov 2014

About the conference

The Testing and Certification Conference 2014 – Global Opportunities and Challenges will be held in Hong Kong, China, on 12-14 November 2014. The goal of the conference is to bring together leading engineers, scientists, researchers and academics from the world to discuss novel theories, technologies and applications in the areas of testing and certification. The conference will feature prominent keynote speakers as well as technical sessions.

Testing and certification has been identified by the HKSAR Government as one of the six industries where Hong Kong has good prospect for development. The Hong Kong Council for Testing and Certification (HKCTC) was established by the HKSAR Government in 2009 to lead, support, advance and promote the development of the industry. Hong Kong is in the leading position in providing academic training to Testing and Certification professionals up to Master degree level.

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